The JEOL IT 210LA Scanning Electron Microscope (SEM), provided by the Polymer Chemistry and Physics Institute of the Academy of Sciences of the Republic of Uzbekistan, offers high-precision imaging and advanced analysis capabilities. This microscope is used in various scientific and industrial applications, particularly in material science, nanotechnology, biomaterials, and other fields. The JEOL IT 210LA model, part of the InTouchScope™ series, stands out with its intuitive touchscreen controls and ease of use.


Using SEM technology, it is possible to study surfaces, identify microscopic structures, and analyze material properties. Through this service, morphological and chemical analysis of various materials and surfaces can be performed.
In addition to providing high-precision images, the microscope expands knowledge about materials and devices, offering deep insights and analysis. The measurement service is based on modern technologies to provide accurate, high-quality, and reliable data.